本文原刊登于Ansys Blog:《Solving Chip Designs at the System Level via HFSS 3D Layout》 作者:Aaron Edwards | Ansys高級應用工程經理 編輯整理:趙陽 | Ansys中國技術支持工程師 使用Ansys HFSS 3D Layout只需34個小時,就能生成并求解上方這個復雜的
warpages in glass detached process Increasing the CTE of UF would reduce the WLP wafer warpage Decreasing the CTE and Young’s modulus of glass would significantly decrease the warpage in stage 2, flip
Creep behaviors of flipchip on board with 96.5Sn-3.5Ag and 100In lead-free solder joints. International Journal of Microcircuits and Electronic Packaging. 24: 11-18.
最初的DRAM采用的是BoC(Board on Chip)結構,隨著“倒裝芯片(FlipChip)”趨勢的發展,MUF材料的需求不斷增長。如今,DRAM方向的MUF材料的占比最高。NAND方向顆粒狀材料需求也在增長。預計未來SiP和WLP(Wafer Level Package,晶圓級封裝)方向的需求會持續增長。